Close Menu
  • Analog Design
    • Latest Analog Layout Interview Questions (2025)
  • Digital Design
    • Digital Electronics Interview Question(2025)
    • Top VLSI Interview Questions
  • Physical Design
    • Physical Design Interview Questions for VLSI Engineers
  • Verilog
    • Verilog Interview Questions(2024)
  • Forum
Facebook Instagram YouTube LinkedIn WhatsApp
SiliconvlsiSiliconvlsi
Ask Questions Register in Forum Login in Forum
Facebook Instagram YouTube LinkedIn WhatsApp
  • Analog Design
    • Latest Analog Layout Interview Questions (2025)
  • Digital Design
    • Digital Electronics Interview Question(2025)
    • Top VLSI Interview Questions
  • Physical Design
    • Physical Design Interview Questions for VLSI Engineers
  • Verilog
    • Verilog Interview Questions(2024)
  • Forum
SiliconvlsiSiliconvlsi
Home»Forum»Steps involved in CMOS Semiconductor Manufacturing Process
Forum

Steps involved in CMOS Semiconductor Manufacturing Process

siliconvlsiBy siliconvlsiSeptember 1, 2023Updated:May 17, 2024No Comments4 Mins Read
Facebook Pinterest LinkedIn Email WhatsApp
Share
Facebook Twitter LinkedIn Pinterest Email

CMOS Fabrication Steps

A typical CMOS (Complementary Metal-Oxide-Semiconductor) semiconductor manufacturing process involves several key steps, each with a specific purpose. Here is an overview of these steps:

Active Region Definition

Purpose: Define the regions where transistors will be constructed. Details: All areas of the die not designated as active regions are covered with a thick layer of silicon dioxide (SiO2), known as the field oxide, to insulate neighboring devices.

Channel-Stop Implant

Purpose: Provide additional insulation between devices by creating reverse-biased np-diodes. Details: An extra p+ region, known as the channel-stop implant or field implant, is added beneath the field oxide.

Formation of Wells

Purpose: Create lightly doped p- and n-wells to house transistors. Details: Ion implantation is used to form n-wells for PMOS transistors and p-wells for NMOS transistors.

Source and Drain Formation

Purpose: Create the source and drain regions of transistors. Details: Heavily doped n-type regions are implanted (or diffused) into the lightly doped p-type substrate for NMOS transistors, and vice versa for PMOS transistors.

Gate Formation

Purpose: Define the channel region between the source and drain. Details: A thin layer of SiO2, known as the gate oxide, is deposited. Polycrystalline silicon (polysilicon) is then deposited and patterned to form the gate of the transistor.

Self-Aligned Process

Purpose: Precisely position the source and drain regions relative to the gate. Details: The location of the source and drain regions is defined by the polysilicon gate, allowing for precise alignment.

Interconnect Layers

Purpose: Provide electrical connections between transistors and other components. Details: Multiple insulated layers of metallic wires, often made of materials like aluminum or copper, are deposited and patterned to create interconnections.

Planarization

Purpose: Ensure a flat and even semiconductor surface for layer deposition. Details: Chemical-mechanical planarization (CMP) is used to microscopically plane the device layer and reduce step heights.

Passivation Layer

Purpose: Provide protection for the semiconductor. Details: A final passivation or over-glass layer, typically made of CVD SiO2, is deposited for protection, often with an additional nitride layer for moisture resistance.

Bonding Pad Formation

Purpose: Create openings for bonding pads used for external connections. Details: Etching openings are made to the pads for bonding, allowing external connections to be made.

The entire process results in a complex structure with multiple layers of materials, including transistors, insulating layers, interconnects, and protective layers. The interconnect layers play a crucial role in connecting the transistors and other components, allowing the integrated circuit to function as intended. This manufacturing process is highly intricate and precise, ensuring the proper functionality of CMOS devices.


What is the purpose of the field oxide in the CMOS fabrication process?

The field oxide serves as an insulator between neighboring devices and covers areas of the die where transistors will not be constructed.

How are lightly doped p- and n-wells formed in the CMOS fabrication process?

Lightly doped p- and n-wells are formed through ion implantation.

What materials are used for the gate of NMOS and PMOS transistors in CMOS fabrication?

The gate is covered by a thin layer of silicon dioxide (gate oxide) and conductive polycrystalline silicon (polysilicon).

What is the significance of the self-aligned process in CMOS fabrication?

The self-aligned process allows for precise positioning of the source and drain regions relative to the gate, ensuring accurate transistor construction.

What is the final step in the CMOS fabrication process after depositing the metallic interconnect layers and passivation layer?

The final processing step involves etching openings to the pads used for bonding the integrated circuit.

What is the purpose of the channel-stop implant (field implant) in CMOS fabrication?

The channel-stop implant adds an extra p+ region beneath the field oxide to create a reverse-biased np-diode, providing additional insulation between devices.

What type of material is used for intermediate planarization steps in CMOS fabrication?

Intermediate planarization steps involve the deposition of insulating material, often silicon dioxide (SiO2).

How are the threshold voltages of PMOS and NMOS transistors adjusted in CMOS fabrication?

Threshold voltages are adjusted through ion implantation in the areas just below the gate oxide.

What is the function of the sacrificial silicon nitride layer in CMOS fabrication?

The sacrificial silicon nitride layer is used during plasma etching to create trenches for insulating the devices and is later removed.

What is the primary material used for the deposition of metallic interconnect layers in CMOS fabrication?

The primary materials used for metallic interconnect layers are often Aluminum and Copper, with Tungsten used for lower layers.

Share. Facebook Twitter Pinterest LinkedIn Tumblr Email

Related Posts

What are Electromigration (EM) and IR-Drop and its prevention?

December 23, 2023

Does NWELL have any impact on NMOS, do we have to consider WPE for NMOS

November 20, 2023

Analog and Digital Layout Design Forum

September 30, 2023
Leave A Reply Cancel Reply

Facebook X (Twitter) Instagram Pinterest Vimeo YouTube
  • About Us
  • Contact Us
  • Privacy Policy
© 2025 Siliconvlsi.

Type above and press Enter to search. Press Esc to cancel.